TEM study of InSbTe crystal morphology as a function of crystallization conditions

Marcel A. Verheijen, Andrei Mijiritskii, Bart J. Kooi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

In this work crystallization of an InSbTe alloy in Blu-ray Disc rewritable (BD-RE) media is studied using Transmission Electron Microscopy (TEM). Two different crystalline states can be formed in a thin InSbTe layer depending on crystallization conditions. These two states give rise to different reflectivity levels of the recording stack as well as a different level of normalized media noise. It is shown that the two states correspond to the same phase (R 3 m), but that they show clear differences in morphology as well as in texture.

Original languageEnglish
Title of host publicationAdvanced data Storage Materials and Characterization Techniques
Place of PublicationWarrendale
PublisherMaterials Research Society
Pages161-166
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2003
Externally publishedYes
EventAdvanced data Storage Materials and Characterization Techniques - Boston, MA, United States
Duration: 1 Dec 20034 Dec 2004

Publication series

NameMaterials Research Society Symposium - Proceedings
Volume803
ISSN (Print)0272-9172

Conference

ConferenceAdvanced data Storage Materials and Characterization Techniques
Country/TerritoryUnited States
CityBoston, MA
Period1/12/034/12/04

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