Original language | English |
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Title of host publication | Proceedings of the 7th European Test Workshop, Corfu Greece, May 2002 |
Pages | 49-54 |
Publication status | Published - 2002 |
Technology driven flash memory test
J. Pineda de Gyvez, R. Beurze
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review