Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

P.L.J. Gunter; H.J. Borg; J.W. Niemantsverdriet; H.J.H. Rheiter

doi:10.1116/1.577718

Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

P.L.J. Gunter, H.J. Borg, J.W. Niemantsverdriet, H.J.H. Rheiter

Inorganic Materials & Catalysis

Research output: Contribution to journal › Article › Academic › peer-review

3 Citations (Scopus)

141 Downloads (Pure)

Abstract

Angle-dependent XPS, static SIMS, and SEM were used to investigate the effect of a cleaning procedure on the compn., morphol., and thickness of passivation layers on tech. Al-4.5% Mg alloy foils. A com. cleaning soln. contg. Na2CO3, Na3PO4, and surfactants not only removed undesirable oil contamination efficiently, but also etched the surface. Because Mg-rich inclusions were etched at a rate higher than that of the surrounding Al, the foil acquired roughness on the scale of .apprx.100 nm, whereas at the same time the surface compn. changed. In particular, small amts. of phosphate were deposited on the surface. All these factors are considered favorable for increased adhesion of org. layers. [on SciFinder (R)]

Original language	English
Pages (from-to)	2846-2851
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
Volume	10
Issue number	4, Pt. 3
DOIs	https://doi.org/10.1116/1.577718
Publication status	Published - 1992

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Gunter, P. L. J., Borg, H. J., Niemantsverdriet, J. W., & Rheiter, H. J. H. (1992). Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 10(4, Pt. 3), 2846-2851. https://doi.org/10.1116/1.577718

Gunter, P.L.J. ; Borg, H.J. ; Niemantsverdriet, J.W. et al. / Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films. 1992 ; Vol. 10, No. 4, Pt. 3. pp. 2846-2851.

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title = "Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils",

abstract = "Angle-dependent XPS, static SIMS, and SEM were used to investigate the effect of a cleaning procedure on the compn., morphol., and thickness of passivation layers on tech. Al-4.5% Mg alloy foils. A com. cleaning soln. contg. Na2CO3, Na3PO4, and surfactants not only removed undesirable oil contamination efficiently, but also etched the surface. Because Mg-rich inclusions were etched at a rate higher than that of the surrounding Al, the foil acquired roughness on the scale of .apprx.100 nm, whereas at the same time the surface compn. changed. In particular, small amts. of phosphate were deposited on the surface. All these factors are considered favorable for increased adhesion of org. layers. [on SciFinder (R)]",

author = "P.L.J. Gunter and H.J. Borg and J.W. Niemantsverdriet and H.J.H. Rheiter",

year = "1992",

doi = "10.1116/1.577718",

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Gunter, PLJ, Borg, HJ, Niemantsverdriet, JW & Rheiter, HJH 1992, 'Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils', Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, vol. 10, no. 4, Pt. 3, pp. 2846-2851. https://doi.org/10.1116/1.577718

Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils. / Gunter, P.L.J.; Borg, H.J.; Niemantsverdriet, J.W. et al.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, Vol. 10, No. 4, Pt. 3, 1992, p. 2846-2851.

Research output: Contribution to journal › Article › Academic › peer-review

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T1 - Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

AU - Gunter, P.L.J.

AU - Borg, H.J.

AU - Niemantsverdriet, J.W.

AU - Rheiter, H.J.H.

PY - 1992

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N2 - Angle-dependent XPS, static SIMS, and SEM were used to investigate the effect of a cleaning procedure on the compn., morphol., and thickness of passivation layers on tech. Al-4.5% Mg alloy foils. A com. cleaning soln. contg. Na2CO3, Na3PO4, and surfactants not only removed undesirable oil contamination efficiently, but also etched the surface. Because Mg-rich inclusions were etched at a rate higher than that of the surrounding Al, the foil acquired roughness on the scale of .apprx.100 nm, whereas at the same time the surface compn. changed. In particular, small amts. of phosphate were deposited on the surface. All these factors are considered favorable for increased adhesion of org. layers. [on SciFinder (R)]

AB - Angle-dependent XPS, static SIMS, and SEM were used to investigate the effect of a cleaning procedure on the compn., morphol., and thickness of passivation layers on tech. Al-4.5% Mg alloy foils. A com. cleaning soln. contg. Na2CO3, Na3PO4, and surfactants not only removed undesirable oil contamination efficiently, but also etched the surface. Because Mg-rich inclusions were etched at a rate higher than that of the surrounding Al, the foil acquired roughness on the scale of .apprx.100 nm, whereas at the same time the surface compn. changed. In particular, small amts. of phosphate were deposited on the surface. All these factors are considered favorable for increased adhesion of org. layers. [on SciFinder (R)]

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DO - 10.1116/1.577718

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EP - 2851

JO - Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films

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Gunter PLJ, Borg HJ, Niemantsverdriet JW, Rheiter HJH. Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films. 1992;10(4, Pt. 3):2846-2851. doi: 10.1116/1.577718