Abstract
As modern digital hardware/software systems become more complex, the testing of these systems throughout their entire system life cycle, including design verification, production testing, and field testing, becomes a severe problem. In this paper a structured approach is presented to solve the problems of system-level testability. A strategy towards design for system-level testability is introduced, which consists of partitioning the system specification into testable parts, and inserting implementation-independent test functionality in the specification. Incorporating these test requirements in the hardware/software implementation will considerably improve system-level testability. The design and implementation of a traffic-lights control system is presented as an example to illustrate the benefits of this approach
| Original language | English |
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| Title of host publication | Proc. International Test Conference 1994, Washington, DC, 2-6 October 1994 |
| Place of Publication | New York |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 134-142 |
| ISBN (Print) | 0-7803-2102-2 |
| DOIs | |
| Publication status | Published - 1994 |
| Event | 1994 International Test Conference (ITC 1994) - Washington, United States Duration: 2 Oct 1994 → 6 Oct 1994 |
Conference
| Conference | 1994 International Test Conference (ITC 1994) |
|---|---|
| Abbreviated title | ITC 1994 |
| Country/Territory | United States |
| City | Washington |
| Period | 2/10/94 → 6/10/94 |