SYSTEM AND METHOD FOR CHARACTERIZING A COATING SUCH AS A PAINT FILM BY RADIATION, AND PAINTING FACILITY WITH SUCH A SYSTEM

Deran Maas (Inventor), Branimir Radisavljevic (Inventor), Mariya Porus (Inventor), Dook Van Mechelen (Inventor)

Research output: PatentPatent publication

Abstract

A sensor system (1) for measuring a parameter of at least one paint layer provided on a surface of an object (2) is provided. It comprises a robot arm (40), a measuring device (42) mounted to the robot arm (40), comprising: a radiation emitter (10) and a radiation receiver (20), which preferably work in the Terahertz range, a sensor arrangement (25) for sensing an orientation and optionally a distance of the measuring device (42) with respect to a surface of the object (2) when the measuring device is positioned in a predefined pose, a control unit (30) configured for controlling the robot arm (40), and for controlling the operation of the measuring device (42), wherein the control unit (30) is configured to control a movement of the robot arm (42) with the measuring device (40) about the object (2), for carrying out a measurement of a parameter of the at least one paint layer at at least one predefined measuring location on the surface of the object (2), by taking into account positioning data of the robot arm (40) and measurement data from the sensor arrangement (25) and optionally from the radiation receiver (20), so that prior to carrying out a measurement: a distance between the measuring device (42) and the surface of the object (2) is adjusted to be in a predefined distance range, and a vector of the measuring direction of the measuring device (42) is adjusted to be normal with respect to the surface of the object (2) within an angular tolerance range from -5° to 5°. Further, a respective method is provided, and a coating facility including such a sensor system.

Original languageEnglish
Patent numberWO2019101803
IPCG01B 11/ 27 A N
Priority date24/11/17
Publication statusPublished - 31 May 2019
Externally publishedYes

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