Synthetic multilayer crystals for EPMA of ultra-light elements

G.F. Bastin, H.J.M. Heijligers

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

Two multilayer crystals (W/Si and Mo/B4C) were used for the electron microprobe detn. of ultra-light elements. [on SciFinder (R)]

@article{3ef8bc5c28a241a2926a6748a5429389,

title = "Synthetic multilayer crystals for EPMA of ultra-light elements",

abstract = "Two multilayer crystals (W/Si and Mo/B4C) were used for the electron microprobe detn. of ultra-light elements. [on SciFinder (R)]",

author = "G.F. Bastin and H.J.M. Heijligers",

year = "1993",

language = "English",

volume = "2",

pages = "5188--5189",

journal = "Microbeam Analysis",

issn = "1061-3420",

number = "SUPPL.",

}

TY - JOUR

T1 - Synthetic multilayer crystals for EPMA of ultra-light elements

AU - Bastin, G.F.

AU - Heijligers, H.J.M.

PY - 1993

Y1 - 1993

N2 - Two multilayer crystals (W/Si and Mo/B4C) were used for the electron microprobe detn. of ultra-light elements. [on SciFinder (R)]

AB - Two multilayer crystals (W/Si and Mo/B4C) were used for the electron microprobe detn. of ultra-light elements. [on SciFinder (R)]

M3 - Article

SN - 1061-3420

VL - 2

SP - 5188

EP - 5189

JO - Microbeam Analysis

JF - Microbeam Analysis

IS - SUPPL.

ER -