Synthetic multilayer crystals for EPMA of ultra-light elements

G.F. Bastin, H.J.M. Heijligers

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Two multilayer crystals (W/Si and Mo/B4C) were used for the electron microprobe detn. of ultra-light elements. [on SciFinder (R)]
Original languageEnglish
Pages (from-to)5188-5189
JournalMicrobeam Analysis
Volume2
Issue numberSUPPL.
Publication statusPublished - 1993

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