Synchronous full-scan for asynchronous handshake circuits

F. Beest, te, A.M.G. Peeters, C.H. Berkel, van, H.G. Kerkhoff

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)
1 Downloads (Pure)

Abstract

Handshake circuits form a special class of asynchronous circuits that has enabled the industrial exploitation of the asynchronous potential such as low power, low electromagnetic emission, and increased cryptographic security. In this paper we present a test solution for handshake circuits that brings synchronous test-quality to asynchronous circuits. We add a synchronous mode of operation to handshake circuits that allows full controllability and observability during test. This technique is demonstrated on some industrial examples and gives over 99% stuck-at fault coverage, using test-pattern generators developed for synchronous circuits. The paper describes how such a full-scan mode can be achieved, including an approach to minimize the number of dummy latches in case latches are used in the data path of the handshake circuit.
Original languageEnglish
Pages (from-to)397-406
JournalJournal of Electronic Testing : Theory and Applications
Volume19
Issue number4
DOIs
Publication statusPublished - 2003

Fingerprint Dive into the research topics of 'Synchronous full-scan for asynchronous handshake circuits'. Together they form a unique fingerprint.

Cite this