Switching data-processing methods for feedback control: breaking the speed versus accuracy trade-off

E.P. van Horssen, D. Antunes, W.P.M.H. Heemels

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
2 Downloads (Pure)

Abstract

In many digitally controlled applications, such as vision-based and data-intensive control, the choice of the data-processing method for distilling (control-relevant) state information is non-trivial and important. While accurate processing methods require significant processing time, limiting the closed-loop control rate, faster methods introduce larger inaccuracies in the distilled state information. This leads to a trade-off between speed and accuracy, which can be considered off-line or on-line. In this paper, we propose an on-line strategy to switch between different data-processing methods in real-time in order to improve closed-loop performance for linear systems.

Original languageEnglish
Title of host publication2015 54th IEEE Conference on Decision and Control, CDC 2015
PublisherInstitute of Electrical and Electronics Engineers
Pages2313-2318
Number of pages6
ISBN (Electronic)978-1-4799-7886-1
DOIs
Publication statusPublished - 1 Dec 2015
Event54th IEEE Conference on Decision and Control (CDC 2015) - "Osaka International Convention Center", Osaka, Japan
Duration: 15 Dec 201518 Dec 2015
Conference number: 54
http://www.cdc2015.ctrl.titech.ac.jp/

Conference

Conference54th IEEE Conference on Decision and Control (CDC 2015)
Abbreviated titleCDC 2015
Country/TerritoryJapan
CityOsaka
Period15/12/1518/12/15
Internet address

Keywords

  • closed loop systems
  • digital control
  • feedback
  • linear systems
  • switching systems (control)
  • closed-loop control rate
  • data-intensive control
  • data-processing method
  • digitally controlled applications
  • distilled state information
  • feedback control
  • speed versus accuracy trade-off
  • switching data-processing methods
  • vision-based control
  • Delays
  • Noise measurement
  • Process control
  • Switches
  • Velocity measurement

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