Surface studies of partially fluorinated polymethacrylates by XPS and LEIS: the outermost atomic layer of polymer films

R.D. van de Grampel, A. Gildenpfennig, W.J.H. van Gennip, W. Ming, J. Lavèn, M.J. Krupers, P.C. Thune, J.W. Niemantsverdriet, H.H. Brongersma, R. van der Linde

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Original languageEnglish
Title of host publication2001 Athens Conference on Coatings : Science and Technology, 2-6 July 2001, Athens, Greece
Place of Publications.l.
Publishers.n.
Pages343-352
Publication statusPublished - Sep 2001

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van de Grampel, R. D., Gildenpfennig, A., van Gennip, W. J. H., Ming, W., Lavèn, J., Krupers, M. J., ... van der Linde, R. (2001). Surface studies of partially fluorinated polymethacrylates by XPS and LEIS: the outermost atomic layer of polymer films. In 2001 Athens Conference on Coatings : Science and Technology, 2-6 July 2001, Athens, Greece (pp. 343-352). s.l.: s.n..