Surface analysis of zeolites: an XPS, variable kinetic energy XPS, and low energy ion scattering study

Simon R. Bare; Axel Knop-Gericke; Detre Teschner; Michael Hävacker; Raoul Blume; Tulio Rocha; Robert Schlögl; Ally S.Y. Chan; N. Blackwell; M. E. Charochak; Rik ter Veen; Hidde H. Brongersma

doi:10.1016/j.susc.2015.10.048

Surface analysis of zeolites: an XPS, variable kinetic energy XPS, and low energy ion scattering study

Simon R. Bare, Axel Knop-Gericke, Detre Teschner, Michael Hävacker, Raoul Blume, Tulio Rocha, Robert Schlögl, Ally S.Y. Chan, N. Blackwell, M. E. Charochak, Rik ter Veen, Hidde H. Brongersma

Elementary Processes in Gas Discharges

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Abstract

The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers.

Original language	English
Pages (from-to)	376-382
Number of pages	7
Journal	Surface Science
Volume	648
DOIs	https://doi.org/10.1016/j.susc.2015.10.048
Publication status	Published - 1 Jun 2016

Keywords

Catalysis
LEIS
Low energy ion scattering spectroscopy
X-ray photoelectron spectroscopy
XPS
Zeolite

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@article{95f373eb4ffe44cf820e5ef3fa7db23b,

title = "Surface analysis of zeolites: an XPS, variable kinetic energy XPS, and low energy ion scattering study",

abstract = "The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers.",

keywords = "Catalysis, LEIS, Low energy ion scattering spectroscopy, X-ray photoelectron spectroscopy, XPS, Zeolite",

author = "Bare, {Simon R.} and Axel Knop-Gericke and Detre Teschner and Michael H{\"a}vacker and Raoul Blume and Tulio Rocha and Robert Schl{\"o}gl and Chan, {Ally S.Y.} and N. Blackwell and Charochak, {M. E.} and {ter Veen}, Rik and Brongersma, {Hidde H.}",

year = "2016",

month = jun,

day = "1",

doi = "10.1016/j.susc.2015.10.048",

language = "English",

volume = "648",

pages = "376--382",

journal = "Surface Science",

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TY - JOUR

T1 - Surface analysis of zeolites

T2 - an XPS, variable kinetic energy XPS, and low energy ion scattering study

AU - Bare, Simon R.

AU - Knop-Gericke, Axel

AU - Teschner, Detre

AU - Hävacker, Michael

AU - Blume, Raoul

AU - Rocha, Tulio

AU - Schlögl, Robert

AU - Chan, Ally S.Y.

AU - Blackwell, N.

AU - Charochak, M. E.

AU - ter Veen, Rik

AU - Brongersma, Hidde H.

PY - 2016/6/1

Y1 - 2016/6/1

N2 - The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers.

AB - The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers.

KW - Catalysis

KW - LEIS

KW - Low energy ion scattering spectroscopy

KW - X-ray photoelectron spectroscopy

KW - XPS

KW - Zeolite

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DO - 10.1016/j.susc.2015.10.048

M3 - Article

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SN - 0039-6028

VL - 648

SP - 376

EP - 382

JO - Surface Science

JF - Surface Science

ER -

Surface analysis of zeolites: an XPS, variable kinetic energy XPS, and low energy ion scattering study

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