Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 507-508 |
| Journal | Japanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers |
| Volume | 26 |
| Issue number | suppl. 26-3 |
| Publication status | Published - 1987 |
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Suppression of the mass enhancement in cerium boride (CeB6) in high magnetic fields. / Joss, W.; Ruitenbeek, van, J.M.; Crabtree, G.W.; Tholence, J.L.; Deursen, van, A.P.J.; Fisk, Z.
In: Japanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers, Vol. 26, No. suppl. 26-3, 1987, p. 507-508.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - Suppression of the mass enhancement in cerium boride (CeB6) in high magnetic fields
AU - Joss, W.
AU - Ruitenbeek, van, J.M.
AU - Crabtree, G.W.
AU - Tholence, J.L.
AU - Deursen, van, A.P.J.
AU - Fisk, Z.
PY - 1987
Y1 - 1987
N2 - The effective mass of the itinerant electrons in the Kondo lattice system CeB6 is found to be strongly field dependent. Measurements of the de Haas-van Alphen effect at temperatures down to 60 mK in steady magnetic fields up to 22 T show a change of more than 100% in the cyclotron effective mass, decreasing with increasing field. The origin of the effect is not known but it is noted that a field of about 10 T corresponds to the energy scales in the system.
AB - The effective mass of the itinerant electrons in the Kondo lattice system CeB6 is found to be strongly field dependent. Measurements of the de Haas-van Alphen effect at temperatures down to 60 mK in steady magnetic fields up to 22 T show a change of more than 100% in the cyclotron effective mass, decreasing with increasing field. The origin of the effect is not known but it is noted that a field of about 10 T corresponds to the energy scales in the system.
M3 - Article
VL - 26
SP - 507
EP - 508
JO - Japanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers
JF - Japanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers
SN - 0021-4922
IS - suppl. 26-3
ER -