Abstract
The high vertical index contrast and the small thickness of InP-based membrane
structures bonded with BCB on Silicon allow the realization of very small devices. Since
photonic integrated circuits consist of both passive and active components, a successful
active-passive integration with sub-micrometer active regions is an essential step. In
this paper we will present our results on active-passive integration with sub-micrometer
active areas. The interference of active and passive area shows a good quality in terms
of morphology. Moreover we find that in the sub-micrometer size active area, the
degradation of the material(InGaAsP QWs) due to clean room processing is limited.
| Original language | English |
|---|---|
| Title of host publication | Proceedings 14th Annual Symposium of the IEEE Photonics Benelux Chapter, 5-6 November 2009, Brussels, Belgium |
| Editors | St. Beri, Ph. Tassin, G. Craggs, X. Leijtens, J. Danckaert |
| Place of Publication | Brussels |
| Publisher | Brussels University Press |
| Pages | 121-124 |
| ISBN (Print) | 978-90-5487-650-2 |
| Publication status | Published - 2009 |
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