Structural integrity of ceramic multilayer capacitor materials and ceramic multilayer capacitors

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Abstract

An review with 61 refs. is given of the fracture of and stress situation in ceramic capacitor materials and ceramic multilayer capacitors. A brief introduction to the relevant concepts is given first. Next the data for capacitor materials and the data for capacitors are discussed. The materials data are not directly transferable to the components. A wide variability of component properties exist, dependent on all microstructural features. Details on the microstructure itself are generally lacking. It is concluded that the effect and amt. of subcrit. crack growth and residual stress in the ceramic and of relaxation of the metal parts on the mech. behavior of capacitors is insufficiently known for reliable longevity predictions. [on SciFinder (R)]
Original languageEnglish
Pages (from-to)323-336
JournalJournal of the European Ceramic Society
Volume12
Issue number5
DOIs
Publication statusPublished - 1993

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