Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: The Limitation and Implementation

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.

Original languageEnglish
Title of host publication2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers
Pages1-10
Number of pages10
ISBN (Electronic)9789075815368
DOIs
Publication statusPublished - 7 Oct 2020
Event22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - https://epe-ecce-conferences.com/epe2020/, Lyon, France
Duration: 7 Sep 202011 Sep 2020
https://epe-ecce-conferences.com/epe2020

Conference

Conference22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
Abbreviated titleEPE'20 ECCE Europe
Country/TerritoryFrance
CityLyon
Period7/09/2011/09/20
Internet address

Keywords

  • Device Modeling
  • Device Simulation
  • Fault Handling Strategy
  • MOSFET
  • Protection Device

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