Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: The Limitation and Implementation

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Abstract

This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.

Original languageEnglish
Title of host publication2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9789075815368
DOIs
Publication statusPublished - Sep 2020
Event22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - Lyon, France
Duration: 7 Sep 202011 Sep 2020

Conference

Conference22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
CountryFrance
CityLyon
Period7/09/2011/09/20

Keywords

  • Device Modeling
  • Device Simulation
  • Fault Handling Strategy
  • MOSFET
  • Protection Device

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