Abstract
This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.
Original language | English |
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Title of host publication | 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1-10 |
Number of pages | 10 |
ISBN (Electronic) | 9789075815368 |
DOIs | |
Publication status | Published - 7 Oct 2020 |
Event | 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - https://epe-ecce-conferences.com/epe2020/, Lyon, France Duration: 7 Sept 2020 → 11 Sept 2020 https://epe-ecce-conferences.com/epe2020 |
Conference
Conference | 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe |
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Abbreviated title | EPE'20 ECCE Europe |
Country/Territory | France |
City | Lyon |
Period | 7/09/20 → 11/09/20 |
Internet address |
Funding
This paper is part of the AutoDrive Project. AutoDrive has received funding within the Electronic Components and Systems for European Leadership Joint Undertaking (ECSEL JU) in collaboration with the European Union’s H2020 Framework Programme (H2020/2014-2020) and National Authorities, under grant agreement 737469.
Funders | Funder number |
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European Union's Horizon 2020 - Research and Innovation Framework Programme | H2020/2014-2020 |
National Authorities | 737469 |
Electronic Components and Systems for European Leadership |
Keywords
- Device Modeling
- Device Simulation
- Fault Handling Strategy
- MOSFET
- Protection Device