Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: The Limitation and Implementation

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Abstract

This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.

Original languageEnglish
Title of host publication2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers
Pages1-10
Number of pages10
ISBN (Electronic)9789075815368
DOIs
Publication statusPublished - 7 Oct 2020
Event22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - https://epe-ecce-conferences.com/epe2020/, Lyon, France
Duration: 7 Sept 202011 Sept 2020
https://epe-ecce-conferences.com/epe2020

Conference

Conference22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
Abbreviated titleEPE'20 ECCE Europe
Country/TerritoryFrance
CityLyon
Period7/09/2011/09/20
Internet address

Funding

This paper is part of the AutoDrive Project. AutoDrive has received funding within the Electronic Components and Systems for European Leadership Joint Undertaking (ECSEL JU) in collaboration with the European Union’s H2020 Framework Programme (H2020/2014-2020) and National Authorities, under grant agreement 737469.

FundersFunder number
European Union's Horizon 2020 - Research and Innovation Framework ProgrammeH2020/2014-2020
National Authorities737469
Electronic Components and Systems for European Leadership

    Keywords

    • Device Modeling
    • Device Simulation
    • Fault Handling Strategy
    • MOSFET
    • Protection Device

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