Strain distribution in single, suspended germanium nanowires studied using nanofocused x-rays

M. Keplinger, R. Grifone, J. Greil, D. Kriegner, J. Persson, A. Lugstein, T. Schülli, J. Stangl

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)
163 Downloads (Pure)

Abstract

Within the quest for direct band-gap group IV materials, strain engineering in germanium is one promising route. We present a study of the strain distribution in single, suspended germanium nanowires using nanofocused synchrotron radiation. Evaluating the probed Bragg reflection for different illumination positions along the nanowire length results in corresponding strain components as well as the nanowire's tilting and bending. By using these findings we determined the complete strain state with the help of finite element modelling. The resulting information provides us with the possibility of evaluating the validity of the strain investigations following from Raman scattering experiments which are based on the assumption of purely uniaxial strain.

Original languageEnglish
Article number055705
Pages (from-to)1-11
JournalNanotechnology
Volume27
Issue number5
DOIs
Publication statusPublished - 12 Jan 2016

Keywords

  • finit element method
  • germanium
  • nanofocused XRD
  • single nanowire
  • strain distribution
  • μ-Raman

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