STM Imaging of ordered dopant incorporation in GaAs

P.M. Koenraad, M.B. Johnson, H.W.M. Salemink, J.H. Wolter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. of the 25th intern. symposium on compound semiconductors
Place of Publication	San Diego, USA
Publication status	Published - 1997
Event	25th International Symposium on Compound Semiconductors - Duration: 8 Sept 1997 → 11 Sept 1997

Conference	25th International Symposium on Compound Semiconductors
Period	8/09/97 → 11/09/97
Other	25th International Symposium on Compound Semiconductors

Cite this

@inproceedings{ab50b5338a1d4f9eb6f2f6b1b75a9db1,

title = "STM Imaging of ordered dopant incorporation in GaAs",

author = "P.M. Koenraad and M.B. Johnson and H.W.M. Salemink and J.H. Wolter",

year = "1997",

language = "English",

booktitle = "Proc. of the 25th intern. symposium on compound semiconductors",

note = "25th International Symposium on Compound Semiconductors ; Conference date: 08-09-1997 Through 11-09-1997",

}

TY - GEN

T1 - STM Imaging of ordered dopant incorporation in GaAs

AU - Koenraad, P.M.

AU - Johnson, M.B.

AU - Salemink, H.W.M.

AU - Wolter, J.H.

PY - 1997

Y1 - 1997

M3 - Conference contribution

BT - Proc. of the 25th intern. symposium on compound semiconductors

CY - San Diego, USA

T2 - 25th International Symposium on Compound Semiconductors

Y2 - 8 September 1997 through 11 September 1997

ER -