Statistical timing for parametric yield prediction of digital integrated circuits.

J.A.G. Jess, K. Kalafala, S.R. Naidu, R.H.J.M. Otten, C. Visweswariah

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 40th ACM/IEEE Design Automation Conference
Pages	932-937
Publication status	Published - 2003
Event	conference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06 - Duration: 2 Jun 2003 → 6 Jun 2003

Conference	conference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06
Period	2/06/03 → 6/06/03
Other	DAC 2003, Anaheim CA, USA

Cite this

@inproceedings{1ba48b497fc34e92bfa86bb54b3071e4,

title = "Statistical timing for parametric yield prediction of digital integrated circuits.",

author = "J.A.G. Jess and K. Kalafala and S.R. Naidu and R.H.J.M. Otten and C. Visweswariah",

year = "2003",

language = "English",

pages = "932--937",

booktitle = "Proceedings of the 40th ACM/IEEE Design Automation Conference",

note = "conference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06 ; Conference date: 02-06-2003 Through 06-06-2003",

}

TY - GEN

T1 - Statistical timing for parametric yield prediction of digital integrated circuits.

AU - Jess, J.A.G.

AU - Kalafala, K.

AU - Naidu, S.R.

AU - Otten, R.H.J.M.

AU - Visweswariah, C.

PY - 2003

Y1 - 2003

M3 - Conference contribution

SP - 932

EP - 937

BT - Proceedings of the 40th ACM/IEEE Design Automation Conference

T2 - conference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06

Y2 - 2 June 2003 through 6 June 2003

ER -