Statistical timing for parametric yield prediction of digital integrated circuits.

J.A.G. Jess, K. Kalafala, S.R. Naidu, R.H.J.M. Otten, C. Visweswariah

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

80 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 40th ACM/IEEE Design Automation Conference
Pages932-937
Publication statusPublished - 2003
Eventconference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06 -
Duration: 2 Jun 20036 Jun 2003

Conference

Conferenceconference; DAC 2003, Anaheim CA, USA; 2003-06-02; 2003-06-06
Period2/06/036/06/03
OtherDAC 2003, Anaheim CA, USA

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