Abstract
A semiconductor memory device includes n-wells (22) and p-wells (24) used to make up a plurality of memory cell elements (40). The n-wells (22) and p-5 wells (24) can be back-biased to improve reading and writing performance. One of the n-wells and p-wells can be globally biased while the other one of the n-wells and p-wells can be biased by groups, such as blocks, rows or columns. Error reduction and/or correction can be performed by adjusting the well bias.
| Original language | English |
|---|---|
| Patent number | US8107288 B2 |
| Publication status | Published - 31 Jan 2012 |
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