Static low-energy ion scattering

R. H. Bergmans; W. J. Huppertz; R. G. van Welzenis; H. H. Brongersma

doi:10.1016/0168-583X(92)95538-3

Static low-energy ion scattering

R. H. Bergmans
, W. J. Huppertz
, R. G. van Welzenis
, H. H. Brongersma

Applied Physics and Science Education

Research output: Contribution to journal › Article › Academic › peer-review

7 Citations (Scopus)

Abstract

A new type of energy analyzer (EARISS) has been developed that makes a very efficient use of the back-scattered ions. This enables the use of extremely low ion doses ("static" conditions). For instance, a spectrum of an Au₂₀Pd₈₀ alloy could be obtained with a dose as low as 100 pC. Together with measurements on HOPG(0001) it demonstrates the new possibilities for LEIS using EARISS.

Original language	English
Pages (from-to)	584-587
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume	64
Issue number	1-4
DOIs	https://doi.org/10.1016/0168-583X(92)95538-3
Publication status	Published - 2 Feb 1992

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AU - van Welzenis, R. G.

AU - Brongersma, H. H.

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ER -

Static low-energy ion scattering

Abstract

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