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State of the Art in processor test and debug.

  • C. Ciordas
  • , J.T.M.H. Dielissen
  • , B.L. Otero

Research output: Book/Report › Report › Academic

Original languageEnglish
Place of PublicationEindhoven
PublisherPhilips Research Laboratories
Number of pages60
Publication statusPublished - 2002

Publication series

NameTechnical note 2002/471

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