Sputtering in surface conversion negative ion sources

R.M.A. Heeren, M.J. Graaf, de, D.B. Meyler, D. Ciric, H.J. Hopman, A.W. Kleyn

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

In negative ion surface conversion sources with barium converters sputtering of hydrogenous surface particles is believed to be the dominant negative ion production mechanism. In the work performed at the FOM-Institute ion sputtering is also used as cleaning and diagnostic tool. This paper will review the work related to the sputtering mechanisms applied in the FOM surface conversion experiment over the last years. It will be shown that not only sputtering but also direct reflection and prompt rebound sputtering contribute to the negative ion formation on a barium surface.
Original languageEnglish
Title of host publicationProduction and neutralization of negative ions and beams : sixth international symposium, Upton, NY, November 9-13, 1992
EditorsJ.G. Alessi, A. Hershcovitch
Place of PublicationNew York
PublisherAmerican Institute of Physics
Pages588-594
ISBN (Print)1-563-96103-2
DOIs
Publication statusPublished - 1994
Eventconference; International Symposium on Production and Neutralization of Negative Ions and Beams (6th ; Nov. 1992 ; Upton,) -
Duration: 1 Jan 1994 → …

Publication series

NameAIP Conference Proceedings
Volume287
ISSN (Print)0094-243X

Conference

Conferenceconference; International Symposium on Production and Neutralization of Negative Ions and Beams (6th ; Nov. 1992 ; Upton,)
Period1/01/94 → …
OtherInternational Symposium on Production and Neutralization of Negative Ions and Beams (6th ; Nov. 1992 ; Upton,)

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    Heeren, R. M. A., Graaf, de, M. J., Meyler, D. B., Ciric, D., Hopman, H. J., & Kleyn, A. W. (1994). Sputtering in surface conversion negative ion sources. In J. G. Alessi, & A. Hershcovitch (Eds.), Production and neutralization of negative ions and beams : sixth international symposium, Upton, NY, November 9-13, 1992 (pp. 588-594). (AIP Conference Proceedings; Vol. 287). American Institute of Physics. https://doi.org/10.1063/1.44834