Abstract
The noise properties of a δ-doped semiconductor structure was investigated at temperatures from 77 K to 300 K. The temperature-dependence of the parameter α of 1/f noise was experimentally determined. The activation energies of the trapping centers in each sample were determined by analyzing the temperature dependence of the generation-recombination noise (g-r noise).
| Original language | English |
|---|---|
| Title of host publication | Noise in physical systems and 1/f fluctuations |
| Subtitle of host publication | proceedings of the 14th International Conference, Leuven, Belgium, 14-18 July 1997 |
| Editors | C. Claeys, E. Simoen |
| Place of Publication | Singapore |
| Publisher | World Scientific |
| Pages | 457-460 |
| Number of pages | 4 |
| ISBN (Print) | 9810231415 |
| Publication status | Published - 1 Dec 1997 |
| Event | 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations - Leuven, Belgium Duration: 14 Jul 1997 → 18 Jul 1997 |
Conference
| Conference | 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations |
|---|---|
| City | Leuven, Belgium |
| Period | 14/07/97 → 18/07/97 |
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