Abstract
An analysis is presented of the resolution limits of two alternative methods for deducing the light-emission profile in organic light-emitting diodes (OLEDs) from the angular and polarization dependent emission spectra. The comparison includes the "fit-profile" (FP) method, within which the known physics of the recombination process is employed to describe the shape of the profile using a strongly reduced number of degrees of freedom, and the Tikhonov method, which provides a more general solution. First, the cases of a delta-function shaped emission profile and a broad single-peak emission profile are investigated. It is demonstrated that for these cases a ~1¿nm resolution of the peak position may be obtained, provided that the peak is positioned optimally in the OLED microcavity. Subsequently, an analysis is given for a double-peak emission profile and for a rectangular profile, as may be obtained in multilayer OLEDs, revealing a resolution of ~10¿nm for the cases studied. It is suggested that, in general, an optimal analysis should be based on a combined Tikhonov-FP approach.
Original language | English |
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Article number | 084512 |
Pages (from-to) | 084512-1/9 |
Number of pages | 9 |
Journal | Journal of Applied Physics |
Volume | 110 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2011 |