Source temperature measurements of an ultracold electron source

W.J. Engelen, M.A. van der Heijden, E.P. Smakman, N. Debernardi, E.J.D. Vredenbregt, O.J. Luiten

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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Original languageEnglish
Title of host publicationProceedings of the 34th Annual conference of the Division Atomic, Molecular and Optical Physics (NNV-AMO), 12-13 October 2010, Lunteren
Pages29
Number of pages1
Publication statusPublished - 2010
Event34th Annual Meeting NNV AMO Lunteren, October 12-13, 2010, Lunteren, The Netherlands - De Werelt, Lunteren, Netherlands
Duration: 12 Oct 201013 Oct 2010

Conference

Conference34th Annual Meeting NNV AMO Lunteren, October 12-13, 2010, Lunteren, The Netherlands
CountryNetherlands
CityLunteren
Period12/10/1013/10/10

Cite this

Engelen, W. J., van der Heijden, M. A., Smakman, E. P., Debernardi, N., Vredenbregt, E. J. D., & Luiten, O. J. (2010). Source temperature measurements of an ultracold electron source. In Proceedings of the 34th Annual conference of the Division Atomic, Molecular and Optical Physics (NNV-AMO), 12-13 October 2010, Lunteren (pp. 29). [P14]