Single vs. multi layer critical area extractions : a comparative study for yield prediction

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, November 1990
Pages	47-61
Publication status	Published - 1991

Cite this

@inproceedings{f9bf43e2493547f68e2316cdcd5ae4b2,

title = "Single vs. multi layer critical area extractions : a comparative study for yield prediction",

author = "{Pineda de Gyvez}, J.",

year = "1991",

language = "English",

pages = "47--61",

booktitle = "Proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, November 1990",

}