Single-shot ultrafast electron diffraction

O.J. Luiten, W.J. Engelen, S.B. Geer, van der, A.J.C. Klessens, T. Oudheusden, van, P.L.E.M. Pasmans, M.P. Reijnders, E.P. Smakman, G. Taban, E.J.D. Vredenbregt

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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Original languageEnglish
Title of host publicationBanff Meeting on Structural Dynamics with Xrays and Electrons, 25-28 February, Banff, Alberta, Canada
Pages1/1-
Publication statusPublished - 2010
Event1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada - Banff, Canada
Duration: 25 Feb 201028 Feb 2010

Conference

Conference1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada
CountryCanada
CityBanff
Period25/02/1028/02/10
Other"Ultrafast Dynamics with X-rays and Electrons"

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