Single-shot ultrafast electron diffraction

O.J. Luiten; W.J. Engelen; S.B. Geer, van der; A.J.C. Klessens; T. Oudheusden, van; P.L.E.M. Pasmans; M.P. Reijnders; E.P. Smakman; G. Taban; E.J.D. Vredenbregt

Single-shot ultrafast electron diffraction

O.J. Luiten, W.J. Engelen, S.B. Geer, van der, A.J.C. Klessens, T. Oudheusden, van, P.L.E.M. Pasmans, M.P. Reijnders, E.P. Smakman, G. Taban, E.J.D. Vredenbregt

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

2 Downloads (Pure)

Original language	English
Title of host publication	Banff Meeting on Structural Dynamics with Xrays and Electrons, 25-28 February, Banff, Alberta, Canada
Pages	1/1-
Publication status	Published - 2010
Event	1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada - Banff, Canada Duration: 25 Feb 2010 → 28 Feb 2010

Conference

Conference	1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada
Country/Territory	Canada
City	Banff
Period	25/02/10 → 28/02/10
Other	"Ultrafast Dynamics with X-rays and Electrons"

Cite this

@inproceedings{c44561c28e744b438d417281317c38e6,

title = "Single-shot ultrafast electron diffraction",

author = "O.J. Luiten and W.J. Engelen and {Geer, van der}, S.B. and A.J.C. Klessens and {Oudheusden, van}, T. and P.L.E.M. Pasmans and M.P. Reijnders and E.P. Smakman and G. Taban and E.J.D. Vredenbregt",

year = "2010",

language = "English",

pages = "1/1--",

booktitle = "Banff Meeting on Structural Dynamics with Xrays and Electrons, 25-28 February, Banff, Alberta, Canada",

note = "1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada ; Conference date: 25-02-2010 Through 28-02-2010",

}

Luiten, OJ, Engelen, WJ, Geer, van der, SB, Klessens, AJC, Oudheusden, van, T, Pasmans, PLEM, Reijnders, MP, Smakman, EP, Taban, G & Vredenbregt, EJD 2010, Single-shot ultrafast electron diffraction. in Banff Meeting on Structural Dynamics with Xrays and Electrons, 25-28 February, Banff, Alberta, Canada. pp. 1/1-, 1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada, Banff, Canada, 25/02/10.

TY - GEN

T1 - Single-shot ultrafast electron diffraction

AU - Luiten, O.J.

AU - Engelen, W.J.

AU - Geer, van der, S.B.

AU - Klessens, A.J.C.

AU - Oudheusden, van, T.

AU - Pasmans, P.L.E.M.

AU - Reijnders, M.P.

AU - Smakman, E.P.

AU - Taban, G.

AU - Vredenbregt, E.J.D.

PY - 2010

Y1 - 2010

M3 - Conference contribution

SP - 1/1-

BT - Banff Meeting on Structural Dynamics with Xrays and Electrons, 25-28 February, Banff, Alberta, Canada

T2 - 1st Banff Meeting on Structural Dynamics, February 25-28, 2010, Banff, Canada

Y2 - 25 February 2010 through 28 February 2010

ER -