Simulation and measurement of RTS noise in n-channel mosfets under switched bias conditions

A.P. Wel, van der, E.A.M. Klumperink, B. Nauta, L.K.J. Vandamme, S.L.J. Gierkink

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationICNF 2001 - 16th International Conference on Noise in Physical Systems and 1/f Fluctuations
Place of PublicationGainesville, Florida USA
PublisherWorld Scientific
ISBN (Print)981-02-4677-3
Publication statusPublished - 2001

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