Simulation and measurement of interconnects and on-chip passives : gauge fields and ghosts as numerical tools

  • W. Schoenmaker
  • , P. Meuris
  • , E. Janssens
  • , M. Verschaeve
  • , E. Seebacher
  • , W. Pflanzl
  • , M. Stucchi
  • , B. Mandeep
  • , K. Maex
  • , W.H.A. Schilders

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

This paper describes the present status of using lattice gauge and ghost field methods for the simulation of on-chip interconnects and integrated passive components at low and high frequencies. Test structures have been developed and characterized in order to confront the simulation techniques with experimental data. The solution method gives results that are in agreement with the measurements.
Original languageEnglish
Title of host publicationProgress in Industrial Mathematics at ECMI 2004 (Proceedings 13th European Conference on Mathematics for Industry, Eindhoven, The Netherlands, June 21-25, 2004)
EditorsA. Di Bucchianico, R.M.M. Mattheij, M.A. Peletier
Place of PublicationBerlin
PublisherSpringer
Pages57-73
ISBN (Print)3-540-28073-1
DOIs
Publication statusPublished - 2006

Publication series

NameMathematics in Industry
Volume8
ISSN (Print)1612-3956

Fingerprint

Dive into the research topics of 'Simulation and measurement of interconnects and on-chip passives : gauge fields and ghosts as numerical tools'. Together they form a unique fingerprint.

Cite this