Simulation, a tool for designing-in reliability

A.C. Brombacher, E. Geest, van, R. Arendsen, A. Steenwijk, van, O. Herrmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

1 Citation (Scopus)


This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor-sets). The paper describes the backgrounds of stressor-susceptibility analysis, the need for this analysis and the way this method is used for high-level design and optimization of electronic circuits.
Original languageEnglish
Title of host publicationPapers presented at the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 1992 (ESREF '92), Schwbisch Gmund, Germany
EditorsH.H. Berger, W.H. Gerling
Place of PublicationChichester
Publication statusPublished - 1993
Eventconference; ESREF '92 -
Duration: 1 Jan 1993 → …

Publication series

NameQuality and Reliability Engineering International
ISSN (Print)0748-8017


Conferenceconference; ESREF '92
Period1/01/93 → …
OtherESREF '92


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