Shunt capacitor bank switching: Stresses and test methods (2nd part) (Cigre WG 13-04)

I. Bonfanti; K. Frohlich; P. Jonsson; M. Morant; K. Nakanishi; R. O‘Leary; A. Penfold; N. Poupardin; M. Seeger; R.P.P. Smeets; D. Vondereck; M.A. Waldron; C. Guilloux; G.C. Damstra; E. Emolumento; H. Heiermeier

Shunt capacitor bank switching: Stresses and test methods (2nd part) (Cigre WG 13-04)

I. Bonfanti, K. Frohlich, P. Jonsson, M. Morant, K. Nakanishi, R. O‘Leary, A. Penfold, N. Poupardin, M. Seeger, R.P.P. Smeets, D. Vondereck, M.A. Waldron, C. Guilloux, G.C. Damstra, E. Emolumento, H. Heiermeier

Electrical Energy Systems

Research output: Contribution to journal › Article › Academic › peer-review

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Original language	English
Pages (from-to)	12-41
Number of pages	30
Journal	Electra
Issue number	183
Publication status	Published - 1999

Cite this

@article{f0d230027f1a4b3898cd7c32e17634ec,

title = "Shunt capacitor bank switching: Stresses and test methods (2nd part) (Cigre WG 13-04)",

author = "I. Bonfanti and K. Frohlich and P. Jonsson and M. Morant and K. Nakanishi and R. O{\textquoteleft}Leary and A. Penfold and N. Poupardin and M. Seeger and R.P.P. Smeets and D. Vondereck and M.A. Waldron and C. Guilloux and G.C. Damstra and E. Emolumento and H. Heiermeier",

year = "1999",

language = "English",

pages = "12--41",

journal = "Electra",

issn = "0424-7701",

publisher = "CIGRE",

number = "183",

}

TY - JOUR

T1 - Shunt capacitor bank switching: Stresses and test methods (2nd part) (Cigre WG 13-04)

AU - Bonfanti, I.

AU - Frohlich, K.

AU - Jonsson, P.

AU - Morant, M.

AU - Nakanishi, K.

AU - O‘Leary, R.

AU - Penfold, A.

AU - Poupardin, N.

AU - Seeger, M.

AU - Smeets, R.P.P.

AU - Vondereck, D.

AU - Waldron, M.A.

AU - Guilloux, C.

AU - Damstra, G.C.

AU - Emolumento, E.

AU - Heiermeier, H.

PY - 1999

Y1 - 1999

M3 - Article

SP - 12

EP - 41

JO - Electra

JF - Electra

SN - 0424-7701

IS - 183

ER -