Shunt capacitor bank switching: Stresses and test methods (1st part)(Cigre WG 13-04)

I. Bonfanti; K. Frohlich; P. Jonsson; M. Morant; K. Nakanishi; R. O‘Leary; A. Penfold; N. Poupardin; M. Seeger; R.P.P. Smeets; D. Vondereck; M.A. Waldron; G.C. Damstra; C. Guilloux; E. Emolumento; H. Heiermeier

Shunt capacitor bank switching: Stresses and test methods (1st part)(Cigre WG 13-04)

I. Bonfanti, K. Frohlich, P. Jonsson, M. Morant, K. Nakanishi, R. O‘Leary, A. Penfold, N. Poupardin, M. Seeger, R.P.P. Smeets, D. Vondereck, M.A. Waldron, G.C. Damstra, C. Guilloux, E. Emolumento, H. Heiermeier

Electrical Energy Systems

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

No abstract

Original language	English
Pages (from-to)	164-189
Number of pages	26
Journal	Electra
Issue number	182
Publication status	Published - 1999

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@article{8303b4b7222c4d5abcd0d37b5a30b909,

title = "Shunt capacitor bank switching: Stresses and test methods (1st part)(Cigre WG 13-04)",

abstract = "No abstract",

author = "I. Bonfanti and K. Frohlich and P. Jonsson and M. Morant and K. Nakanishi and R. O{\textquoteleft}Leary and A. Penfold and N. Poupardin and M. Seeger and R.P.P. Smeets and D. Vondereck and M.A. Waldron and G.C. Damstra and C. Guilloux and E. Emolumento and H. Heiermeier",

year = "1999",

language = "English",

pages = "164--189",

journal = "Electra",

issn = "0424-7701",

publisher = "CIGRE",

number = "182",

}

TY - JOUR

T1 - Shunt capacitor bank switching: Stresses and test methods (1st part)(Cigre WG 13-04)

AU - Bonfanti, I.

AU - Frohlich, K.

AU - Jonsson, P.

AU - Morant, M.

AU - Nakanishi, K.

AU - O‘Leary, R.

AU - Penfold, A.

AU - Poupardin, N.

AU - Seeger, M.

AU - Smeets, R.P.P.

AU - Vondereck, D.

AU - Waldron, M.A.

AU - Damstra, G.C.

AU - Guilloux, C.

AU - Emolumento, E.

AU - Heiermeier, H.

PY - 1999

Y1 - 1999

N2 - No abstract

AB - No abstract

M3 - Article

SN - 0424-7701

SP - 164

EP - 189

JO - Electra

JF - Electra

IS - 182

ER -

Shunt capacitor bank switching: Stresses and test methods (1st part)(Cigre WG 13-04)

Abstract

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