SHrimp: descriptive patterns in a tree

Sibylle Hess, Nico Piatkowski, Katharina Morik

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
5 Downloads (Pure)

Abstract

The appliance of the minimum description length (MDL) principle to the field of theory mining enables a precise description of main characteristics of a dataset in comparison to the numerous and hardly understandable output of the popular frequent pattern mining algorithms. The loss function that determines the quality of a pattern selection with respect to the MDL principle is however difficult to analyze and the selection is computed heuristically for all known algorithms. With SHrimp, the attempt to create a data structure that re ects the influences of the pattern selection to the database and that enables a faster computation of the quality of the selection is initiated.

Original languageEnglish
Title of host publicationLWA 2014 Workshops KDML, IR and FGWM
Subtitle of host publicationProceedings of the 16th LWA Workshops: KDML, IR and FGWM Aachen, Germany, September 8-10, 2014.
EditorsThomas Seidl, Marwan Hassani, Christian Beecks
PublisherCEUR-WS.org
Pages181-192
Number of pages12
Publication statusPublished - 10 Sep 2014
Externally publishedYes
Event16th Workshops on Learning, Knowledge, Adaptation, LWA 2014: Knowledge Discovery, Data Mining and Machine Learning, KDML 2014, Information Retrieval, IR 2014 and Knowledge Management, FGWM 2014 - Aachen, Germany
Duration: 8 Sep 201410 Sep 2014
http://ceur-ws.org/Vol-1226/ (link to proceedings)

Publication series

NameCEUR Workshop Proceedings
Number1226
ISSN (Print)1613-0073

Conference

Conference16th Workshops on Learning, Knowledge, Adaptation, LWA 2014: Knowledge Discovery, Data Mining and Machine Learning, KDML 2014, Information Retrieval, IR 2014 and Knowledge Management, FGWM 2014
CountryGermany
CityAachen
Period8/09/1410/09/14
Internet address

Keywords

  • Itemsets
  • MDL
  • Pattern mining
  • Pattern selection

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