Semiconductors studied by cross-sectional scanning tunneling microscopy

J.K. Garleff; J.M. Ulloa; P.M. Koenraad

doi:10.1007/978-3-642-10497-8

Semiconductors studied by cross-sectional scanning tunneling microscopy

J.K. Garleff, J.M. Ulloa, P.M. Koenraad

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

1 Citation (Scopus)

Abstract

No abstract.

Original language	English
Title of host publication	Scanning probe microscopy in nanoscience and nanotechnology 2
Editors	B. Bhushan
Place of Publication	Heidelberg
Publisher	Springer
Pages	321-353
ISBN (Print)	978-3-642-10946-1
DOIs	https://doi.org/10.1007/978-3-642-10497-8
Publication status	Published - 2011

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10.1007/978-3-642-10497-8

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title = "Semiconductors studied by cross-sectional scanning tunneling microscopy",

abstract = "No abstract.",

author = "J.K. Garleff and J.M. Ulloa and P.M. Koenraad",

year = "2011",

doi = "10.1007/978-3-642-10497-8",

language = "English",

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editor = "B. Bhushan",

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TY - CHAP

T1 - Semiconductors studied by cross-sectional scanning tunneling microscopy

AU - Garleff, J.K.

AU - Ulloa, J.M.

AU - Koenraad, P.M.

PY - 2011

Y1 - 2011

N2 - No abstract.

AB - No abstract.

U2 - 10.1007/978-3-642-10497-8

DO - 10.1007/978-3-642-10497-8

M3 - Chapter

SN - 978-3-642-10946-1

SP - 321

EP - 353

BT - Scanning probe microscopy in nanoscience and nanotechnology 2

A2 - Bhushan, B.

PB - Springer

CY - Heidelberg

ER -

Semiconductors studied by cross-sectional scanning tunneling microscopy

Abstract

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