TY - JOUR
T1 - Self-assembled germanium-dot multilayers embedded in silicon
AU - Bauer, G.
AU - Darhuber, A.A.
AU - Holy, V.
PY - 1999
Y1 - 1999
N2 - We report mainly on structural investigations on nanoscale Ge rich islands, the growth of which is driven by misfit strain (Stranski-Krastanow growth mode). Results of several methods, i.e. atomic force microscopy, transmission electron microscopy, and mainly x-ray diffraction and x-ray reflectivity measurements are presented and discussed.
AB - We report mainly on structural investigations on nanoscale Ge rich islands, the growth of which is driven by misfit strain (Stranski-Krastanow growth mode). Results of several methods, i.e. atomic force microscopy, transmission electron microscopy, and mainly x-ray diffraction and x-ray reflectivity measurements are presented and discussed.
U2 - 10.1002/(SICI)1521-4079(199902)34:2<197::AID-CRAT197>3.0.CO;2-A
DO - 10.1002/(SICI)1521-4079(199902)34:2<197::AID-CRAT197>3.0.CO;2-A
M3 - Article
VL - 34
SP - 197
EP - 209
JO - Crystal Research and Technology
JF - Crystal Research and Technology
SN - 0232-1300
IS - 2
ER -