Selected quantitative studies of patents in standards

  • R.N.A. Bekkers
  • , J. Baron
  • , A. Martinelli
  • , Y. Ménière
  • , Z.O. Nomaler
  • , T. Pohlmann

Research output: Book/ReportReportAcademic

335 Downloads (Pure)
Original languageEnglish
Place of PublicationTokyo
PublisherHitotsubashi University
Number of pages77
Publication statusPublished - 2014

Publication series

NamePIE/CIS Working Paper
Volume626

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