Selected quantitative studies of patents in standards

R.N.A. Bekkers, J. Baron, A. Martinelli, Y. Ménière, Z.O. Nomaler, T. Pohlmann

Research output: Book/ReportReportAcademic

137 Downloads (Pure)
Original languageEnglish
Place of PublicationTokyo
PublisherHitotsubashi University
Number of pages77
Publication statusPublished - 2014

Publication series

NamePIE/CIS Working Paper
Volume626

Cite this

Bekkers, R. N. A., Baron, J., Martinelli, A., Ménière, Y., Nomaler, Z. O., & Pohlmann, T. (2014). Selected quantitative studies of patents in standards. (PIE/CIS Working Paper; Vol. 626). Tokyo: Hitotsubashi University.
Bekkers, R.N.A. ; Baron, J. ; Martinelli, A. ; Ménière, Y. ; Nomaler, Z.O. ; Pohlmann, T. / Selected quantitative studies of patents in standards. Tokyo : Hitotsubashi University, 2014. 77 p. (PIE/CIS Working Paper).
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Bekkers, RNA, Baron, J, Martinelli, A, Ménière, Y, Nomaler, ZO & Pohlmann, T 2014, Selected quantitative studies of patents in standards. PIE/CIS Working Paper, vol. 626, Hitotsubashi University, Tokyo.

Selected quantitative studies of patents in standards. / Bekkers, R.N.A.; Baron, J.; Martinelli, A.; Ménière, Y.; Nomaler, Z.O.; Pohlmann, T.

Tokyo : Hitotsubashi University, 2014. 77 p. (PIE/CIS Working Paper; Vol. 626).

Research output: Book/ReportReportAcademic

TY - BOOK

T1 - Selected quantitative studies of patents in standards

AU - Bekkers, R.N.A.

AU - Baron, J.

AU - Martinelli, A.

AU - Ménière, Y.

AU - Nomaler, Z.O.

AU - Pohlmann, T.

PY - 2014

Y1 - 2014

M3 - Report

T3 - PIE/CIS Working Paper

BT - Selected quantitative studies of patents in standards

PB - Hitotsubashi University

CY - Tokyo

ER -

Bekkers RNA, Baron J, Martinelli A, Ménière Y, Nomaler ZO, Pohlmann T. Selected quantitative studies of patents in standards. Tokyo: Hitotsubashi University, 2014. 77 p. (PIE/CIS Working Paper).