Seebeck measurements as a powerful technique to characterize TCO materials

W.H. van Helvoort, C.I.M.A. Spee, I. Volintiru, M.C.M. Sanden, van de, A.D. Kuypers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Original languageEnglish
Title of host publicationProceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece
Publication statusPublished - 2006

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