Seebeck measurements as a powerful technique to characterize TCO materials

W.H. van Helvoort, C.I.M.A. Spee, I. Volintiru, M.C.M. Sanden, van de, A.D. Kuypers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Original language	English
Title of host publication	Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece
Pages	-204
Publication status	Published - 2006

Cite this

@inproceedings{967b3811a93c4112935e537fff3ca17a,

title = "Seebeck measurements as a powerful technique to characterize TCO materials",

author = "{van Helvoort}, W.H. and C.I.M.A. Spee and I. Volintiru and {Sanden, van de}, M.C.M. and A.D. Kuypers",

year = "2006",

language = "English",

pages = "--204",

booktitle = "Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece",

}

Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece. 2006. p. -204.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Seebeck measurements as a powerful technique to characterize TCO materials

AU - van Helvoort, W.H.

AU - Spee, C.I.M.A.

AU - Volintiru, I.

AU - Sanden, van de, M.C.M.

AU - Kuypers, A.D.

PY - 2006

Y1 - 2006

M3 - Conference contribution

SP - -204

BT - Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece

ER -