Secure key generation from biased PUFs

Roel Maes, Vincent van der Leest, E. van der Sluis, F.M.J. Willems

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

60 Citations (Scopus)
324 Downloads (Pure)


PUF-based key generators have been widely considered as a root-of-trust in digital systems. They typically require an error-correcting mechanism (e.g. based on the code-offset method) for dealing with bit errors between the enrollment and reconstruction of keys. When the used PUF does not have full entropy, entropy leakage between the helper data and the device-unique key material can occur. If the entropy level of the PUF becomes too low, the PUF-derived key can be attacked through the publicly available helper data. In this work we provide several solutions for preventing this entropy leakage for PUFs suffering from i.i.d. biased bits. The methods proposed in this work pose no limit on the amount of bias that can be tolerated, which solves an important open problem for PUF-based key generation. Additionally, the solutions are all evaluated based on reliability, efficiency, leakage and reusability showing that depending on requirements for the key generator different solutions are preferable.
Original languageEnglish
Title of host publicationCryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings
EditorsT. Güneysu, H. Handschuh
Place of PublicationBerlin
ISBN (Electronic)978-3-662-48324-4
ISBN (Print)978-3-662-48323-7
Publication statusPublished - 2015
Event17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France - Palais du Grand Large, Saint-Malo, France
Duration: 13 Sept 201516 Sept 2015

Publication series

ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Workshop17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France
Abbreviated titleCHES 2015
Internet address


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