Secure key generation from biased PUFs

Roel Maes; Vincent van der Leest; E. van der Sluis; F.M.J. Willems

doi:10.1007/978-3-662-48324-4_26

Secure key generation from biased PUFs

Roel Maes, Vincent van der Leest, E. van der Sluis, F.M.J. Willems

Signal Processing Systems

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

60 Citations (Scopus)

324 Downloads (Pure)

Abstract

PUF-based key generators have been widely considered as a root-of-trust in digital systems. They typically require an error-correcting mechanism (e.g. based on the code-offset method) for dealing with bit errors between the enrollment and reconstruction of keys. When the used PUF does not have full entropy, entropy leakage between the helper data and the device-unique key material can occur. If the entropy level of the PUF becomes too low, the PUF-derived key can be attacked through the publicly available helper data. In this work we provide several solutions for preventing this entropy leakage for PUFs suffering from i.i.d. biased bits. The methods proposed in this work pose no limit on the amount of bias that can be tolerated, which solves an important open problem for PUF-based key generation. Additionally, the solutions are all evaluated based on reliability, efficiency, leakage and reusability showing that depending on requirements for the key generator different solutions are preferable.

Original language	English
Title of host publication	Cryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings
Editors	T. Güneysu, H. Handschuh
Place of Publication	Berlin
Publisher	Springer
Pages	517-534
ISBN (Electronic)	978-3-662-48324-4
ISBN (Print)	978-3-662-48323-7
DOIs	https://doi.org/10.1007/978-3-662-48324-4_26
Publication status	Published - 2015
Event	17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France - Palais du Grand Large, Saint-Malo, France Duration: 13 Sept 2015 → 16 Sept 2015 http://www.chesworkshop.org/ches2015/

Publication series

Name	LNCS
Publisher	Springer
Volume	9203
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Workshop

Workshop	17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France
Abbreviated title	CHES 2015
Country/Territory	France
City	Saint-Malo
Period	13/09/15 → 16/09/15
Internet address	http://www.chesworkshop.org/ches2015/

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10.1007/978-3-662-48324-4_26

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Maes, R., van der Leest, V., van der Sluis, E., & Willems, F. M. J. (2015). Secure key generation from biased PUFs. In T. Güneysu, & H. Handschuh (Eds.), Cryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings (pp. 517-534). (LNCS; Vol. 9203). Springer. https://doi.org/10.1007/978-3-662-48324-4_26

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note = "17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France, CHES 2015 ; Conference date: 13-09-2015 Through 16-09-2015",

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Maes, R, van der Leest, V, van der Sluis, E & Willems, FMJ 2015, Secure key generation from biased PUFs. in T Güneysu & H Handschuh (eds), Cryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings. LNCS, vol. 9203, Springer, Berlin, pp. 517-534, 17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France, Saint-Malo, France, 13/09/15. https://doi.org/10.1007/978-3-662-48324-4_26

Secure key generation from biased PUFs. / Maes, Roel; van der Leest, Vincent; van der Sluis, E. et al.
Cryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings. ed. / T. Güneysu; H. Handschuh. Berlin: Springer, 2015. p. 517-534 (LNCS; Vol. 9203).

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

TY - CHAP

T1 - Secure key generation from biased PUFs

AU - Maes, Roel

AU - van der Leest, Vincent

AU - van der Sluis, E.

AU - Willems, F.M.J.

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N2 - PUF-based key generators have been widely considered as a root-of-trust in digital systems. They typically require an error-correcting mechanism (e.g. based on the code-offset method) for dealing with bit errors between the enrollment and reconstruction of keys. When the used PUF does not have full entropy, entropy leakage between the helper data and the device-unique key material can occur. If the entropy level of the PUF becomes too low, the PUF-derived key can be attacked through the publicly available helper data. In this work we provide several solutions for preventing this entropy leakage for PUFs suffering from i.i.d. biased bits. The methods proposed in this work pose no limit on the amount of bias that can be tolerated, which solves an important open problem for PUF-based key generation. Additionally, the solutions are all evaluated based on reliability, efficiency, leakage and reusability showing that depending on requirements for the key generator different solutions are preferable.

AB - PUF-based key generators have been widely considered as a root-of-trust in digital systems. They typically require an error-correcting mechanism (e.g. based on the code-offset method) for dealing with bit errors between the enrollment and reconstruction of keys. When the used PUF does not have full entropy, entropy leakage between the helper data and the device-unique key material can occur. If the entropy level of the PUF becomes too low, the PUF-derived key can be attacked through the publicly available helper data. In this work we provide several solutions for preventing this entropy leakage for PUFs suffering from i.i.d. biased bits. The methods proposed in this work pose no limit on the amount of bias that can be tolerated, which solves an important open problem for PUF-based key generation. Additionally, the solutions are all evaluated based on reliability, efficiency, leakage and reusability showing that depending on requirements for the key generator different solutions are preferable.

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SP - 517

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BT - Cryptographic Hardware and Embedded Systems -- CHES 2015 : 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings

A2 - Güneysu, T.

A2 - Handschuh, H.

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CY - Berlin

T2 - 17th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2015), September 13-16, 2015, Saint-Malo, France

Y2 - 13 September 2015 through 16 September 2015

ER -

Secure key generation from biased PUFs

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