Scattering length and effective range for scattering in a plane and in higher dimensions

B.J. Verhaar, L.P.H. Goey, de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Abstract only.
Original languageEnglish
Title of host publicationProceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands
EditorsA.E. Vries, de, M.J. Wiel, van der
Place of PublicationNetherlands, Amsterdam
Pages127-
Publication statusPublished - 1985

Publication series

NameEurophysics Conference Abstracts
Volume9B
ISSN (Print)0378-2271

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Verhaar, B. J., & Goey, de, L. P. H. (1985). Scattering length and effective range for scattering in a plane and in higher dimensions. In A. E. Vries, de, & M. J. Wiel, van der (Eds.), Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands (pp. 127-). (Europhysics Conference Abstracts; Vol. 9B). Netherlands, Amsterdam.
Verhaar, B.J. ; Goey, de, L.P.H. / Scattering length and effective range for scattering in a plane and in higher dimensions. Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands. editor / A.E. Vries, de ; M.J. Wiel, van der. Netherlands, Amsterdam, 1985. pp. 127- (Europhysics Conference Abstracts).
@inproceedings{d388a16a2f7540d287fdf1db9f6f2243,
title = "Scattering length and effective range for scattering in a plane and in higher dimensions",
abstract = "Abstract only.",
author = "B.J. Verhaar and {Goey, de}, L.P.H.",
year = "1985",
language = "English",
series = "Europhysics Conference Abstracts",
pages = "127--",
editor = "{Vries, de}, A.E. and {Wiel, van der}, M.J.",
booktitle = "Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands",

}

Verhaar, BJ & Goey, de, LPH 1985, Scattering length and effective range for scattering in a plane and in higher dimensions. in AE Vries, de & MJ Wiel, van der (eds), Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands. Europhysics Conference Abstracts, vol. 9B, Netherlands, Amsterdam, pp. 127-.

Scattering length and effective range for scattering in a plane and in higher dimensions. / Verhaar, B.J.; Goey, de, L.P.H.

Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands. ed. / A.E. Vries, de; M.J. Wiel, van der. Netherlands, Amsterdam, 1985. p. 127- (Europhysics Conference Abstracts; Vol. 9B).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Scattering length and effective range for scattering in a plane and in higher dimensions

AU - Verhaar, B.J.

AU - Goey, de, L.P.H.

PY - 1985

Y1 - 1985

N2 - Abstract only.

AB - Abstract only.

M3 - Conference contribution

T3 - Europhysics Conference Abstracts

SP - 127-

BT - Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands

A2 - Vries, de, A.E.

A2 - Wiel, van der, M.J.

CY - Netherlands, Amsterdam

ER -

Verhaar BJ, Goey, de LPH. Scattering length and effective range for scattering in a plane and in higher dimensions. In Vries, de AE, Wiel, van der MJ, editors, Proceedings of the Second European Conference on Atomic and Molecular Physics, 15-19 april, Amsterdam, Netherlands. Netherlands, Amsterdam. 1985. p. 127-. (Europhysics Conference Abstracts).