Scanning electron microscopy : power spectrum analysis

M. Rudnaya; J.M.L. Maubach; R.M.M. Mattheij

doi:10.3217/978-3-85125-062-6-091

Scanning electron microscopy : power spectrum analysis

M. Rudnaya
, J.M.L. Maubach
, R.M.M. Mattheij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

No abstract.

Original language	English
Title of host publication	Proceedings of the 9th Multinational Conference on Microscopy (MC 2009, Graz, Austria, August 30-September 4, 2009)
Editors	G. Kothleiner, M. Leisch
Place of Publication	Graz
Publisher	Graz University of Technology
Pages	185-186
DOIs	https://doi.org/10.3217/978-3-85125-062-6-091
Publication status	Published - 2009

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10.3217/978-3-85125-062-6-091

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@inproceedings{b72d643b80e247ceb7ff164e64af5c85,

title = "Scanning electron microscopy : power spectrum analysis",

abstract = "No abstract.",

author = "M. Rudnaya and J.M.L. Maubach and R.M.M. Mattheij",

year = "2009",

doi = "10.3217/978-3-85125-062-6-091",

language = "English",

pages = "185--186",

editor = "G. Kothleiner and M. Leisch",

booktitle = "Proceedings of the 9th Multinational Conference on Microscopy (MC 2009, Graz, Austria, August 30-September 4, 2009)",

publisher = "Graz University of Technology",

}

Scanning electron microscopy : power spectrum analysis. / Rudnaya, M.; Maubach, J.M.L.; Mattheij, R.M.M.
Proceedings of the 9th Multinational Conference on Microscopy (MC 2009, Graz, Austria, August 30-September 4, 2009). ed. / G. Kothleiner; M. Leisch. Graz: Graz University of Technology, 2009. p. 185-186.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Scanning electron microscopy : power spectrum analysis

AU - Rudnaya, M.

AU - Maubach, J.M.L.

AU - Mattheij, R.M.M.

PY - 2009

Y1 - 2009

N2 - No abstract.

AB - No abstract.

U2 - 10.3217/978-3-85125-062-6-091

DO - 10.3217/978-3-85125-062-6-091

M3 - Conference contribution

SP - 185

EP - 186

BT - Proceedings of the 9th Multinational Conference on Microscopy (MC 2009, Graz, Austria, August 30-September 4, 2009)

A2 - Kothleiner, G.

A2 - Leisch, M.

PB - Graz University of Technology

CY - Graz

ER -

Scanning electron microscopy : power spectrum analysis

Abstract

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