Scalability of AlGaN/GaN HEMTs

B. Jacobs, F. Karouta, J.J.M. Kwaspen, R. Crane, P.R. Hageman, L.M.F. Kaufmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 2nd STW Workshop on Semiconductor Advances for Future Electronics (SAFE 99)
Pages205-208
Publication statusPublished - 1999
Eventconference; 2nd STW Workshop on Semiconductor Advances for Future Electronics (SAFE 99), Mierlo, Netherlands, 24-25 November -
Duration: 1 Jan 1999 → …

Conference

Conferenceconference; 2nd STW Workshop on Semiconductor Advances for Future Electronics (SAFE 99), Mierlo, Netherlands, 24-25 November
Period1/01/99 → …
Other2nd STW Workshop on Semiconductor Advances for Future Electronics (SAFE 99), Mierlo, Netherlands, 24-25 November

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