Abstract
The results of a joint CEN/VAMAS round robin on grain size measurement for advanced technical ceramics have been analysed. The results show that the scatter obtained for measurement of the mean linear intercept length is primarily due to the influence of micrograph preparation and interpretation and, to a lesser extent, also due to random positioning of lines and circles. The results for the mean linear intercept length measurement validate the methods described in a proposed CEN standard. Micrograph preparation and interpretation should be given special attention, as these factors are of major importance for consistent results
| Original language | English |
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| Title of host publication | New horizons for materials : proceedings of the General Section of the Forum on New Materials of the 8th CIMTEC World Ceramics Congress and Forum on New Materials cenzini |
| Editors | P. Vincenzini |
| Place of Publication | Faenza, Italy |
| Publisher | Techna |
| Pages | 601-608 |
| ISBN (Print) | 88-86538-03-0 |
| Publication status | Published - 1995 |