Role of ion accumulation in lofting of submicrometer-sized dielectric particle from dielectric surface by plasma and low-energy electron beam

Pavel Krainov (Corresponding author), Vladimir Ivanov, Dmitry Astakhov, Slava Medvedev, Mark van de Kerkhof

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
2 Downloads (Pure)

Abstract

A particle-in-cell model is used to investigate the dust levitation phenomenon. A submicrometer-sized silicon dioxide particle lying on a silicon dioxide substrate is exposed to a low-energy electron beam and the flux of ions and electrons from a cold plasma. The combined effect of ion and electron accumulation between the particle and the substrate is reported. The results are of interest for dust mitigation in the semiconductor industry, the lunar exploration, and the explanation of the dust levitation.

Original languageEnglish
Title of host publicationOptical and EUV Nanolithography XXXV
EditorsAnna Lio, Martin Burkhardt
PublisherSPIE
Number of pages6
ISBN (Electronic)9781510649781
ISBN (Print)9781510649774
DOIs
Publication statusPublished - 26 May 2022
EventOptical and EUV Nanolithography XXXV 2022 - Virtual, Online
Duration: 23 May 202227 May 2022

Publication series

NameProceedings of SPIE
Volume12051
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical and EUV Nanolithography XXXV 2022
CityVirtual, Online
Period23/05/2227/05/22

Keywords

  • dust
  • electron beam
  • levitation
  • lofting
  • particle-in-cell
  • plasma
  • simulation

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