Fingerprint Dive into the research topics of 'Role of field-effect on c-Si surface passivation by ultrathin (2-20 nm) atomic layer deposited Al2O3'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Role of field-effect on c-Si surface passivation by ultrathin (2-20 nm) atomic layer deposited Al2O3
N.M. Terlinden, G. Dingemans, M.C.M. Sanden, van de, W.M.M. Kessels
Research output: Contribution to journal › Article › Academic › peer-review
96
Citations
(Scopus)
146
Downloads
(Pure)