RF-distortion in deep-submicron CMOS technologies

R. Van Langevelde, L. F. Tiemeijer, R. J. Havens, M. J. Knitel, R. F.M. Roes, P. H. Woerlee, D. B.M. Klaassen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

61 Citations (Scopus)


Dive into the research topics of 'RF-distortion in deep-submicron CMOS technologies'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds