RF characterization of schottky diodes in 65-nm CMOS

Marion K. Matters-Kammerer, L. Tripodi, R. van Langevelde, J. Cumana, Rolf H. Jansen

Research output: Contribution to journalArticleAcademicpeer-review

27 Citations (Scopus)

Fingerprint

Dive into the research topics of 'RF characterization of schottky diodes in 65-nm CMOS'. Together they form a unique fingerprint.

Engineering

Physics