RF and Mixed Signal Testing in the Sector IC Design of Philips Research,

J. Pineda de Gyvez, W. Domans, A.G. Wagemans

Research output: Book/ReportReportAcademic

Original languageEnglish
Place of PublicationEindhoven
PublisherPhilips Research Laboratories
Publication statusPublished - 2003

Publication series

NameNatlab Technical Note
Volume0150

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