Content available in repository
Content available in repository
A. Hubrechsen, Kate A. Remley, Sara Catteau
Research output: Contribution to journal › Article › Academic › peer-review
Internet of things (IoT) devices are proliferating in our connected world, with the number of devices expected to exceed 14 billion in 2023 [1]. Wireless IoT applications are increasing day by day, ranging from cellular-enabled parking meters that can validate your credit card in real time, to trash compactors that inform the garbage company when they are full, to wireless local-area-network-enabled industrial programmable logic controllers (PLCs) that control robots on the factory floor with micron precision. The physical size and shape or form factor of these devices can range from millimeters to meters on a side, and latency requirements can range from hours (e.g., trash compactor) to seconds (e.g., parking meter) to milliseconds or less (e.g., factory floor sensing and control). With all of the possible variations, it is important to have flexible yet accurate test facilities for these devices.
Original language | English |
---|---|
Pages (from-to) | 75-85 |
Number of pages | 11 |
Journal | IEEE Microwave Magazine |
Volume | 23 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1 Feb 2022 |
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Research output: Contribution to journal › Article › Academic › peer-review
Research output: Other contribution › Professional