Revealing the Cell-Material Interface with Nanometer Resolution by Focused Ion Beam/Scanning Electron Microscopy

F. Santoro, W. Zhao, L.M. Joubert, L. Duan, J. Schnitker, Y. van de Burgt, H.Y. Lou, B. Liu, A. Salleo, L. Cui, Yi Cui, B. Cui

Research output: Contribution to journal › Article › Academic › peer-review

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