Resistive switching in nanostructured thin films

  • H. Silva
  • , H.L. Gomes
  • , Y.G. Pogorelov
  • , P. Stallinga
  • , D.M. Leeuw, de
  • , J.P. Araujo
  • , J.B. Sousa
  • , S.C.J. Meskers
  • , G. Kakazei
  • , S. Cardoso
  • , P.P. Freitas

    Research output: Contribution to journalArticleAcademicpeer-review

    28 Citations (Scopus)
    218 Downloads (Pure)

    Abstract

    Planar capacitor structures based on granular films composed of nanometric ferromagnetic grains embedded in an insulating Al2O3 matrix can switch between a high-conductance and a low-conductance state. The switching properties are induced by a forming process. The ON/OFF resistance ratio is as high as 104 under an electrical field of only 15 kV/m. This resistive switching is accompanied by a capacitive switching between two well-defined voltage-independent states, a behavior that is not readily explained by the filamentary type of conduction.
    Original languageEnglish
    Article number202107
    Pages (from-to)202107-1/3
    JournalApplied Physics Letters
    Volume94
    Issue number20
    DOIs
    Publication statusPublished - 2009

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